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DESIGN FOR IDDQ TESTABILITY PDF

testable blocks. ○ Constant-testability designs (C-testable designs). Soma 6 issues in testing and probe card design. CPU. RAM . IDDQ design guidelines. One DFT solution for systems on chip, based on IDDQ measuring concept is presented in this paper. The application of Reconfigurable neurai networks off chi . IDDQ Test With the IDDQ test method one determines the power consumption of a chip at a stable state (quiescent current). Then a chip is.

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This will cause a high current because of the short circuit. Heat sinks, Part 2: ModelSim dfsign How to force a struct type written in SystemVerilog?

Now,Just want to know practically how we measure Iddq current? But be- cause of deviations during manufacture actual values will differ from the expected value.

Applying the same test pattern to several correct chips one obtains different measured current values. To detect such undetectable fault we need to go for Iddq fault modeling where you can apply node with high or low voltage and due to stuck fault their will be significant increase in current.

Measuring air gap of a magnetic core for home-wound inductors and flyback transformer 7.

Iddq testing & pattern generation in DFT(Design For testability)

Thus for desgn given number of measurements one determines a set of test patterns obtaining a maximal fault coverage. Thus the method of IDD Q testing is rather a defect oriente d method than an er r o r oriented method.

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This shall be demonstrated for the e xample of a hard combinatorial bridgin g fault section For example, the fault model includes bridgin g faultsgat e ox- id e shortstransisto r stuck on faultsand some stuc k at faults. Your email address will not be published. Therefore the circuit may not use oscillators, and whenever there are dynamic storage blocks they have to be separated for the test.

This generally occur in fesign as above where redundant logic is present. The threshold value for an IDDQ measurement should be determined according to the expected erroneous current. Synthesized tuning, Part 2: Dec 248: The stop point indicated by the tool is when you should measure the current.

Design for Testability:IDDQ Test | pcb design

I hope you got it. For example, as mentioned above, the correct circuit should have a very low quiescent current such that the erroneous current is easily detectable. I mean we need to observe a single pin for Iddq from top? As an alternative approach the resistor can be re- placed by a capacitor. CMOS Technology file 1. One should never use IDDQ measurements to reduce the number of functional test patterns. Again, for normal operation it oddq shorted and unloaded.

Digital multimeter appears to have measured voltages lower than expected.

For this one may use an extended swit c h level simulation also considering realistic resistances of transistors. Dec 242: With the IDD Q test method one determines the power consumption of a chip at a stable state quiescen t current. The Business of EDA: For example, in [ Such an increase of current might be owed to a physical defect of the chip. Further faults that cause an increase of quiescent current are bridgin g faultsand gat e oxide shorts.

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PV charger battery circuit 4.

Then one has to compare the costs of both kinds of erroneous decisions: Also pul l up resistors have to be disabled for the test mode, and for pa d drivers, analog cells, and bipolar sub- circuits a separate power supply is needed because they typically have a high power consumption.

On the other hand, such simulations can also be used to determine the accuracy needed for an IDDQ measurement. Thus an IDDQ test needs fewer test patterns.

Design for testability for SoC based on IDDQ scanning

Furthermore, for r egula r structured circuits such as storage blocks, IDDQ tests are not of interest be- cause there are already specialized tests available with high defect coverage.

In order to receive meaningful results IDDQ tests should be restricted to such test patterns producing a low power consumption for correct chips. But since such a resistor within a supply line will reduce the applied voltage it has to be shorted by a transistor for normal operation of the chip. If all stu c k at faults could be detected by IDDQ measurements then the circuits obtained would be completely testable for stu c k at faults with only two test patterns.

Built In Current Sensor [